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Analyzes whether a process can consistently meet specifications. Compares process variation to specification limits.
ସୂତ୍ର
Cpk = (specification - mean) ÷ (3 × std dev)
ଷ୍ଟେପ୍-ଷ୍ଟେପ୍ ଗାଇଡ୍ |
- 1Measure process output (25+ samples)
- 2Calculate standard deviation
- 3Define specification limits
- 4Cpk = (specification - mean) ÷ (3 × std dev)
- 5Cpk >1.33 capable, >1.67 excellent
ସମାଧାନ ହୋଇଥିବା ଉଦାହରଣ
ଇନପୁଟ୍
±0.1 spec
ଫଳ
Cpk 0.67
ଏଡ଼ାଇବା ଯୋଗ୍ୟ ସାଧାରଣ ଭୁଲ
- ✕Confusing Cp (potential) with Cpk (actual capability)
- ✕Using too few samples or not accounting for stratification
ବାରମ୍ବାର ଜିଜ୍ଞାସା
What Cpk indicates capability?
Below 1.0 unable to meet spec; 1.0-1.33 capable with tight control; >1.67 excellent.
What causes low Cpk?
High variation, process drift, poor equipment, untrained operators, or unrealistic specifications.
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